Imaging of DNA by photoelectron microscopyHOULE, W. A; GRIFFITH, O. H.Micron and microscopica acta. 1983, Vol 14, Num 4, pp 351-352, issn 0739-6260Article

Problem oriented transmission electron microscopySTOBBS, W. M.Journal of microscopy (Print). 1984, Vol 136, Num 2, pp 137-151, issn 0022-2720Article

Design and performance of an amplifier for EBIC imaging in a scanning electron microscopeMAHER, F. J; ROSSOUW, C. J.Journal of physics. E. Scientific instruments. 1983, Vol 16, Num 12, pp 1238-1241, issn 0022-3735Article

A protocol for 3D image reconstruction from a single image of an oblique sectionTAYLOR, K. A; CROWTHER, R. A.Ultramicroscopy. 1991, Vol 38, Num 1, pp 85-103, issn 0304-3991Article

Influence of some parameters on the surface profile restored from microdensitometer analysis of electron micrographs of surface replicasVARNIER, F; RASIGNI, G; PALMARI, J. P et al.Applied optics. 1984, Vol 23, Num 20, pp 3705-3717, issn 0003-6935Article

Eine Methode zur Vereinheitlichung des Auflösungsvermögens von Elektronenmikrographien für alle Azimutwinkel im Fourier-Leistungsspektrum bei astigmatischer Abbildung = Une méthode pour étalonner la limite de résolution des micrographies électroniques pour tous les angles d'azimut dans le spectre de Fourier et dans la formation d'images astigmatiques = A method to standardize the resolution limit of electron micrographs for all azimuth angles in the Fourier spectrum and astigmatic imagingSHEN, X; BOSECK, S.Optik (Stuttgart). 1984, Vol 68, Num 1, pp 17-25, issn 0030-4026Article

Formation of carbonaceous cenospheres during fluidized-bed combustion of bituminous coalsGAY, A. J; LITTLEJOHN, R. F; VAN DUIN, P. J et al.Fuel (Guildford). 1983, Vol 62, Num 10, pp 1224-1226, issn 0016-2361Article

A description of the causal agent of rose rosette diseaseGERGERICH, R. C; KIM, K. S.1983, Vol 32, Num 3, 7Article

Fourier-Holographie mit Elektronen = Holographie de Fourier avec des électrons = Fourier holography with electronsLAUER, R.Optik (Stuttgart). 1984, Vol 66, Num 2, pp 159-174, issn 0030-4026Article

High-speed computation techniques for the simulation of high resolution electron micrographsVAN DYCK, D.Journal of microscopy (Print). 1983, Vol 132, Num 1, pp 31-42, issn 0022-2720Article

Microdensitometer control using an apple microcomputerANDERSON, J. M; LOW, J. N; TOLLIN, P et al.Journal of microcomputer applications. 1983, Vol 6, Num 4, pp 317-319, issn 0745-7138Article

Les résultats obtenus par la méthode 2 1/2D de microscopie électronique sont-ils fiables?PISKUNOV, D. I.Fizika tverdogo tela. 1985, Vol 27, Num 12, pp 3521-3525, issn 0367-3294Article

Sur l'augmentation de la gamme dynamique de la luminance lors de l'enregistrement d'une image électroniqueGERTSENSHTEJN, M. E; DOLZHENKOV, V. A; KOBZEV, V. V et al.Radiotehnika i elektronika. 1984, Vol 29, Num 5, pp 985-989Article

Automatic selection of macromolecules from electron micrographs by component labelling and symbolic processingHARAUZ, G; FONG-LOCHOVSKY, A.Ultramicroscopy. 1989, Vol 31, Num 4, pp 333-344, issn 0304-3991Article

Recollections of the early days of SEM in the Cambridge University engineering department, 1948-53MCMULLAN, D.Journal of microscopy (Print). 1985, Vol 139, Num 2, pp 129-138, issn 0022-2720Article

Calculation of tilt angles for obtaining stereo transmission electron micrographs from crystalline specimensTAMBUYSER, P.Journal of materials science letters. 1984, Vol 3, Num 2, pp 184-186, issn 0261-8028Article

A simple chemical method of opening and filling carbon nanotubesTSANG, S. C; CHEN, Y. K; HARRIS, P. J. F et al.Nature (London). 1994, Vol 372, Num 6502, pp 159-162, issn 0028-0836Article

Diffraktogramme elektronenmikroskopischer Aufnahmen bei astigmatischer Objektbeleuchtung und Möglichkeiten ihrer Verwendung bei der Richtstrahlwertmessung in astigmatischen Bündeln = Diffractogrammes de micrographies électroniques prises avec un éclairage de l'objet astigmatique et possibilités de leur application pour les mesures de brillance dans les faisceaux astigmatiques = Diffractograms of electron micrographs taken with astigmatic object illumination and the possibilities of their application for brightness measurements in astigmatic beamsHANSSEN, K.-J; ADE, G; LAUER, R et al.Optik (Stuttgart). 1986, Vol 73, Num 4, pp 163-173, issn 0030-4026Article

A simple procedure for evaluating effective scattering cross-sections in STEMKOHL, H.Ultramicroscopy. 1985, Vol 16, Num 2, pp 265-268, issn 0304-3991Article

Observation en microscopie électronique à haute résolution d'oxydes à grande maille (c-Dy₂O₃) et interprétation des images obtenues = High resolution electron microscopy observation of oxides with a large cell and interpretation of formed imagesBEN FREDJ, A; NIHOUL, G.Physica status solidi. A. Applied research. 1985, Vol 91, Num 2, pp 351-369, issn 0031-8965Article

Representation of three-dimensionally reconstructed objects in electron microscopy by surfaces of equal densityRADERMACHER, M; FRANK, J.Journal of microscopy (Print). 1984, Vol 136, Num 1, pp 77-85, issn 0022-2720Article

A versatile film for electron micrographyBLACK, D. L.American biotechnology laboratory. 1999, Vol 17, Num 9, issn 0749-3223, p. 64Article

Magnesium polymer of actin is formed by β-actinin but not by gelsolin-actin complexSHIMAOKA, S; OOSAWA, M; MARUYAMA, K et al.Zoological science. 1991, Vol 8, Num 3, pp 499-504, issn 0289-0003Article

Emission d'électrons dans le cas de commutation d'un ferroélectrique de germanate de plombROZENMAN, G. I; OKHAPKIN, V. A; CHEPELEV, YU. L et al.Pis′ma v žurnal èksperimental′noj i teoretičeskoj fiziki. 1984, Vol 39, Num 9, pp 397-399, issn 0370-274XArticle

Electron micrography and x-ray study of dip-lacquered LiF (220)PALMARI, J; RASIGNI, M; RASIGNI, G et al.Applied optics. 1991, Vol 30, Num 25, pp 3667-3672, issn 0003-6935Article